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  • T. Czyszanowski, M. Dems, K. Panajotov, W. Nakwaski, Crucial Parameters of Photonic-Crystal Holes Within Photonic-Crystal VCSEL DBR, 8th International Conference on Transparent Optical Networks, ICTON 2006, pp. 2 - 181-184, June 2006
  • M. Dems, T. Czyszanowski, K. Panajotov, Plane-wave and cylindrical-wave admittance method for simulation of classical and photonic-crystal-based VCSELs, SPIE Proceedings, France, 03-06 Apr 2006
  • T. Czyszanowski, M. Dems, H. Thienpont, K. Panajotov, Full vectorial electromagnetic modeling of vertical-cavity surface-emitting diode lasers by the plane wave admittance method, SPIE Proceedings, France, 03-05 Apr 2006
  • T. Czyszanowski, M. Dems, H. Thienpont, K. Panajotov, Full Vectorial Electromagnetic Modeling of Vertical-Cavity Surface-Emitting Diode Lasers by the Plane Wave Admittance Method, SPIE Photonics Europe, pp. 6185 - 61850Y, April 2006
  • M. Dems, T. Czyszanowski, K. Panajotov, Plane-Wave and Cylindrical-Wave Admittance Method for Simulation of Classical and Photonic-Crystal-Based VCSELs,, SPIE Photonics Europe, pp. 6182 - 618219, April 2006
  • T. Czyszanowski, M. Dems, W. Nakwaski, Usability Comparison of Scalar and Vectorial Optical Approaches To Simulation of a 1.3μm InGaAsN VCSEL Operation, 6th International Conference on Transparent Optical Networks, pp. 1 - 375-376, July 2004
  • W. Nakwaski, R. Sarzała, M. Wasiak, T. Czyszanowski, P. Maćkowiak, <title>Single-photon devices in quantum cryptography</title>, SPIE Proceedings, 2003
  • R. Sarzała, P. Maćkowiak, M. Wasiak, T. Czyszanowski, W. Nakwaski, <title>Simulation of threshold operation of GaInNAs diode lasers</title>, SPIE Proceedings, 2003
  • P. Maćkowiak, T. Czyszanowski, R. Sarzała, M. Wasiak, W. Nakwaski, <title>Designing of possible structures of nitride vertical-cavity surface-emitting lasers</title>, SPIE Proceedings, 2003
  • B. P. Riely, J. J. Liu, H. Shen, G. Dang, W. H. Chang, Y. Jiang, Z. Sikorski, T. Czyszanowski, A. J. Przekwas, Multiphysics modeling of intracavity-contacted VCSELs, SPIE Proceedings, United States, 27-31 Jan 2003
  • W. Nakwaski, R. Sarzała, M. Wasiak, T. Czyszanowski, P. Maćkowiak, Single-Photon Devices, International Conference on Solid State Crystals: Materials Science, Application, ICSSC, pp. 178, October 2002
  • M. Wasiak, P. Maćkowiak, R. Sarzała, T. Czyszanowski, W. Nakwaski, Broadening Mechanisms Influencing Gain Spectra of 1.3-μm Quantum-Dot (InGa)As/GaAs Lasers, International Conference on Solid State Crystals: Materials Science, Application, ICSSC, pp. 180, October 2002
  • P. Maćkowiak, T. Czyszanowski, R. Sarzała, M. Wasiak, W. Nakwaski, An Optimal Design of Possible Structures of Nitride VCSELs, International Conference on Solid State Crystals: Materials Science, Application, ICSSC, pp. 62, October 2002
  • R. Sarzała, P. Maćkowiak, M. Wasiak, T. Czyszanowski, W. Nakwaski, Simulation of Performance Characteristics of GaInNAs VCSEL Lasers, Conference on Physics, Technology of Dilute Nitrides for Optical Communications, September 2002
  • M. Wasiak, M. Bugajski, R. Sarzała, P. Maćkowiak, T. Czyszanowski, W. Nakwaski, Output Power Saturation in InGaN/GaAs Quantum Dot Lasers, 2nd International Conference on Semiconductor Quantum Dots (QD2002), September 2002
  • M. Wasiak, R. Sarzała, T. Czyszanowski, P. Maćkowiak, W. Nakwaski, M. Bugajski, (InGa)As/GaAs Quantum-Dot Diode Lasers for 1.3-?m Optical Fibre Communication, 4th International Conference on Transparent Optical Networks: ICTON 2002, pp. 1 - 144-147, April 2002
  • R. Sarzała, M. Wasiak, T. Czyszanowski, M. Bugajski, W. Nakwaski, Analysis of Lasing Thresholds of 1.3-μm Oxide-Confined in-Plane Quantum-Dot (InGa)(As/GaAs Lasers, European Workshop on Gallium Arsenide-Based Lasers at 1300 nm, September 2001
  • T. Czyszanowski, W. Nakwaski, Designing of Multiple-Quantum-Well Active Regions in Nitride Diode Lasers, International Conference, Annual Meeting of European Optical Society "From Quantum Optics to Photonics", pp. 67-68, June 2001
  • T. Czyszanowski, Possible Optimization of Arsenide Diode Lasers for Their Operation at Elevated Temperatures, Workshop "Microtechnology, Thermal Problems in Electronics", The International Seminar, THERMIC 2000, pp. 27-33, October 2000