Publikacje i konferencje

M. Dems, K. Panajotov, T. Czyszanowski, R. Kotyński, W. Nakwaski, Simulation of photonic crystal diode lasers with plane-wave admittance method, European Symposium on Photonic Crystals, 2005

M. Dems, R. Kotyński, K. Panajotov, PlaneWave Admittance Method- a novel approach for determining the electromagnetic modes in photonic structures, Opt. Express 13, 3196-3207, 2005

T. Czyszanowski, M. Dems, W. Nakwaski, Usability Comparison of Scalar and Vectorial Optical Approaches To Simulation of a 1.3μm InGaAsN VCSEL Operation, 6th International Conference on Transparent Optical Networks, str. 1 - 375-376, Lipiec 2004

M. Dems, W. Nakwaski, Simplified Analytical Approach To Stress Problems in Multi-Layered Nitride Devices, International Conferenceon Solid State Crystals, Maj 2004

M. Dems, W. Nakwaski, Thermal and molecular stresses in multi-layered structures of nitride devices, Semicond. Sci. Technol. 19(5), 667-667, 2004

M. Dems, W. Nakwaski, The Enhanced Effective Index Method for High-Contrast Photonic Crystal Slabs, 12th International Workshop on Optical Waveguide Theory and Numerical Modeling, Marzec 2004

M. Dems, Modeling of Mechanical Stress Fields in Multi-Layered Structures of Diode Lasers, 1st CEPHONA Workshop on Computer Simulation and Design of Semiconductor Lasers, Listopad 2003

M. Dems, W. Nakwaski, Thermal and molecular stresses in multi-layered structures of nitride devices, Semicond. Sci. Technol. 18(8), 733-737, 2003

M. Dems, W. Nakwaski, Thermal, Molecular Stress Generation in Multi-Layered Structures of Nitride Devices, 5th International Conference "Thermal Problems in Electronics", MicroTherm2003, str. 51-53, Czerwiec 2003

M. Dems, W. Nakwaski, The Self-Consistent Method for Determination of a Band Structure in Photonic Crystals with Frequency-Dependent Dielectric Constants, 5th International Conference on Transparent Optical Networks: ICTON 2003, str. 1 - 276-279, Czerwiec 2003

M. Dems, W. Nakwaski, Thermal and Molecular Stresses in Multi-Layered Structures of Nitride Devices, Semicond. Sci. Technol. 18, 733-737, 2003